JP5615401B1 - 銅微粒子分散液、導電膜形成方法及び回路基板 - Google Patents
銅微粒子分散液、導電膜形成方法及び回路基板 Download PDFInfo
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- 229910052802 copper Inorganic materials 0.000 title claims abstract description 94
- 239000010949 copper Substances 0.000 title claims abstract description 94
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 93
- 239000010419 fine particle Substances 0.000 title claims abstract description 92
- 239000006185 dispersion Substances 0.000 title claims abstract description 44
- 238000000034 method Methods 0.000 title claims description 21
- 239000000758 substrate Substances 0.000 claims abstract description 67
- 239000002612 dispersion medium Substances 0.000 claims abstract description 38
- 239000000463 material Substances 0.000 claims abstract description 20
- 150000007529 inorganic bases Chemical class 0.000 claims abstract description 15
- 125000004437 phosphorous atom Chemical group 0.000 claims abstract description 12
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 9
- 238000005245 sintering Methods 0.000 claims abstract description 9
- 150000001875 compounds Chemical class 0.000 claims abstract description 8
- 239000011521 glass Substances 0.000 claims description 12
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 8
- 239000000919 ceramic Substances 0.000 claims description 5
- BAERPNBPLZWCES-UHFFFAOYSA-N (2-hydroxy-1-phosphonoethyl)phosphonic acid Chemical compound OCC(P(O)(O)=O)P(O)(O)=O BAERPNBPLZWCES-UHFFFAOYSA-N 0.000 claims description 4
- 229940120146 EDTMP Drugs 0.000 claims description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 4
- NFDRPXJGHKJRLJ-UHFFFAOYSA-N edtmp Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CCN(CP(O)(O)=O)CP(O)(O)=O NFDRPXJGHKJRLJ-UHFFFAOYSA-N 0.000 claims description 4
- NJGCRMAPOWGWMW-UHFFFAOYSA-N octylphosphonic acid Chemical compound CCCCCCCCP(O)(O)=O NJGCRMAPOWGWMW-UHFFFAOYSA-N 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- KPWQJFSQMHRNDE-UHFFFAOYSA-L tetrabutylphosphanium;sulfate Chemical compound [O-]S([O-])(=O)=O.CCCC[P+](CCCC)(CCCC)CCCC.CCCC[P+](CCCC)(CCCC)CCCC KPWQJFSQMHRNDE-UHFFFAOYSA-L 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 239000002270 dispersing agent Substances 0.000 description 19
- 239000002245 particle Substances 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 7
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 6
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 239000007864 aqueous solution Substances 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- -1 phosphate ester Chemical class 0.000 description 5
- 229910019142 PO4 Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 239000010452 phosphate Substances 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 3
- 150000001879 copper Chemical class 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 150000003014 phosphoric acid esters Chemical class 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229920003080 Povidone K 25 Polymers 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000007496 glass forming Methods 0.000 description 1
- 229910003471 inorganic composite material Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910001392 phosphorus oxide Inorganic materials 0.000 description 1
- LFGREXWGYUGZLY-UHFFFAOYSA-N phosphoryl Chemical class [P]=O LFGREXWGYUGZLY-UHFFFAOYSA-N 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
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- B22F7/00—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression
- B22F7/02—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers
- B22F7/04—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite layers with one or more layers not made from powder, e.g. made from solid metal
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- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/24—Electrically-conducting paints
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- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/097—Inks comprising nanoparticles and specially adapted for being sintered at low temperature
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1283—After-treatment of the printed patterns, e.g. sintering or curing methods
- H05K3/1291—Firing or sintering at relative high temperatures for patterns on inorganic boards, e.g. co-firing of circuits on green ceramic sheets
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F10/00—Additive manufacturing of workpieces or articles from metallic powder
- B22F10/10—Formation of a green body
- B22F10/16—Formation of a green body by embedding the binder within the powder bed
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
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- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0703—Plating
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Abstract
Description
密着向上剤を含有する。密着向上剤は、銅微粒子を光焼結して基材上に形成される導電膜とその基材との密着性(付着性ともいう)を向上するためのものである。基材は、無機基材、又は無機材料を含む基材である。密着向上剤は、リン原子を含む化合物である。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例5と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例15と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例14と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例16と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例17と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
密着向上剤を分散媒に添加しなかった。それ以外の条件を実施例18と同じにした。皮膜の外観は金属銅の外観に変化したが、導電膜の密着性が得られず、導電膜が基板上に得られなかった。
11 銅微粒子
2 皮膜
3 無機基材
4 導電膜
Claims (4)
- 分散媒と、前記分散媒中に分散された銅微粒子とを有する銅微粒子分散液であって、
前記銅微粒子を光焼結して基材上に形成される導電膜とその基材との密着性を向上するための密着向上剤を含有し、
前記基材は、無機基材であり、
前記密着向上剤は、前記分散媒に添加されており、ヒドロキシエチリデンジホスホン酸、エチレンジアミンテトラメチレンホスホン酸、リン酸、テトラブチルホスホニウムサルフェート、及びオクチルホスホン酸よりなる群から選ばれる、リン原子を含む化合物であることを特徴とする銅微粒子分散液。 - 前記無機基材は、ガラス、セラミックス、シリコンウェハ、及びアルミニウムよりなる群から選ばれることを特徴とする請求項1に記載の銅微粒子分散液。
- 請求項1又は請求項2に記載の銅微粒子分散液の皮膜を無機基材上に形成する工程と、
前記皮膜に光を照射することによって、その皮膜中の銅微粒子を光焼結して導電膜を形成する工程とを有することを特徴とする導電膜形成方法。 - 請求項3に記載の導電膜形成方法によって形成された導電膜を有する回路を無機基材から成る基板上に備えることを特徴とする回路基板。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013101769A JP5615401B1 (ja) | 2013-05-14 | 2013-05-14 | 銅微粒子分散液、導電膜形成方法及び回路基板 |
EP14798409.0A EP2998968A1 (en) | 2013-05-14 | 2014-01-31 | Copper-fine-particle dispersion liquid, conductive-film formation method, and circuit board |
CN201480025673.0A CN105210156A (zh) | 2013-05-14 | 2014-01-31 | 铜微粒分散体、导电膜形成方法以及电路板 |
US14/769,919 US20160029483A1 (en) | 2013-05-14 | 2014-01-31 | Copper particulate dispersion, conductive film forming method, and circuit board |
PCT/JP2014/052221 WO2014185101A1 (ja) | 2013-05-14 | 2014-01-31 | 銅微粒子分散液、導電膜形成方法及び回路基板 |
KR1020157031361A KR20150138331A (ko) | 2013-05-14 | 2014-01-31 | 구리 미립자 분산액, 도전막 형성 방법 및 회로 기판 |
TW103116753A TWI534838B (zh) | 2013-05-14 | 2014-05-12 | 銅微粒子分散液 |
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JP2013101769A JP5615401B1 (ja) | 2013-05-14 | 2013-05-14 | 銅微粒子分散液、導電膜形成方法及び回路基板 |
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JP5615401B1 true JP5615401B1 (ja) | 2014-10-29 |
JP2014222611A JP2014222611A (ja) | 2014-11-27 |
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US (1) | US20160029483A1 (ja) |
EP (1) | EP2998968A1 (ja) |
JP (1) | JP5615401B1 (ja) |
KR (1) | KR20150138331A (ja) |
CN (1) | CN105210156A (ja) |
TW (1) | TWI534838B (ja) |
WO (1) | WO2014185101A1 (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5275498B1 (ja) * | 2012-07-03 | 2013-08-28 | 石原薬品株式会社 | 導電膜形成方法及び焼結進行剤 |
JP6524780B2 (ja) | 2015-04-20 | 2019-06-05 | セイコーエプソン株式会社 | 電気配線部材の製造方法、電気配線部材形成用材料、電気配線部材、電気配線基板の製造方法、電気配線基板形成用材料、電気配線基板、振動子、電子機器および移動体 |
US10298617B2 (en) * | 2015-07-08 | 2019-05-21 | T-Mobile Usa, Inc. | Trust policy for telecommunications device |
EP3758048B1 (en) * | 2015-10-02 | 2022-11-09 | Mitsui Mining & Smelting Co., Ltd. | A bonding junction structure |
US10796812B2 (en) * | 2016-03-15 | 2020-10-06 | Sumitomo Electric Industries, Ltd. | Coating liquid for forming conductive layer, method for producing conductive layer, and conductive layer |
IL247113B (en) * | 2016-08-04 | 2018-02-28 | Copprint Tech Ltd | Formulations and processes for making a high conductivity copper pattern |
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- 2014-01-31 CN CN201480025673.0A patent/CN105210156A/zh active Pending
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KR20150138331A (ko) | 2015-12-09 |
WO2014185101A1 (ja) | 2014-11-20 |
US20160029483A1 (en) | 2016-01-28 |
JP2014222611A (ja) | 2014-11-27 |
CN105210156A (zh) | 2015-12-30 |
TWI534838B (zh) | 2016-05-21 |
TW201515015A (zh) | 2015-04-16 |
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