TWI649559B - Ultrasound imaging device - Google Patents

Ultrasound imaging device Download PDF

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TWI649559B
TWI649559B TW105133050A TW105133050A TWI649559B TW I649559 B TWI649559 B TW I649559B TW 105133050 A TW105133050 A TW 105133050A TW 105133050 A TW105133050 A TW 105133050A TW I649559 B TWI649559 B TW I649559B
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probe
workpiece
holder
interference
imaging device
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TW201713947A (en
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遊佐高広
伊藤正一
北見薰
富田
長岡宏和
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日商日立電力解決方案股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654Imaging
    • G01N29/069Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B8/00Diagnosis using ultrasonic, sonic or infrasonic waves
    • A61B8/44Constructional features of the ultrasonic, sonic or infrasonic diagnostic device
    • A61B8/4483Constructional features of the ultrasonic, sonic or infrasonic diagnostic device characterised by features of the ultrasound transducer
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B8/00Diagnosis using ultrasonic, sonic or infrasonic waves
    • A61B8/44Constructional features of the ultrasonic, sonic or infrasonic diagnostic device
    • A61B8/4444Constructional features of the ultrasonic, sonic or infrasonic diagnostic device related to the probe
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B8/00Diagnosis using ultrasonic, sonic or infrasonic waves
    • A61B8/44Constructional features of the ultrasonic, sonic or infrasonic diagnostic device
    • A61B8/4477Constructional features of the ultrasonic, sonic or infrasonic diagnostic device using several separate ultrasound transducers or probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/023Solids

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  • Radiology & Medical Imaging (AREA)
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  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

為了讓超音波影像裝置偵知探頭和工件間的干涉,而防止探頭、工件受損。 In order for the ultrasonic imaging device to detect the interference between the probe and the workpiece, the probe and the workpiece are prevented from being damaged.

超音波影像裝置(1)係具備:利用超音波將面狀的工件(8)予以影像化之探頭(4)、對於工件(8)的面讓探頭(4)進行掃描之三軸掃描器(2)、以及用於偵測工件(8)和探頭(4)間的干涉之感測器(3)。 The ultrasonic imaging device (1) is provided with a probe (4) for imaging a planar workpiece (8) using ultrasonic waves, and a three-axis scanner (4) for scanning the surface of the workpiece (8) by the probe (4) ( 2), and a sensor (3) for detecting interference between the workpiece (8) and the probe (4).

Description

超音波影像裝置 Ultrasound imaging device

本發明是關於具有探頭干涉偵測功能之超音波影像裝置。 The invention relates to an ultrasonic imaging device with a probe interference detection function.

以往,超音波影像裝置(SAT:Scanning Acoustic Tomograph),是在水中設置半導體、積體電路等的被檢體、即面狀的工件,將稱作探頭之超音波發送接收感測器沿該工件的面進行掃描並利用超音波進行測定。藉此,能夠調查工件是否存在有缺陷(剝離、孔洞)。 Conventionally, an ultrasonic imaging device (SAT: Scanning Acoustic Tomograph) is a surface-shaped workpiece in which an object such as a semiconductor or integrated circuit is installed in water, and an ultrasonic transmitting and receiving sensor called a probe is provided along the workpiece. The surface was scanned and measured using ultrasound. This makes it possible to investigate whether there are defects (peeling, holes) in the workpiece.

工件和探頭的距離會依條件而改變,例如可能靠近到毫米等級以下,這時探頭和工件可能發生干涉。在發生該干涉的情況,可能會使工件及探頭受到損傷而造成問題。 The distance between the workpiece and the probe will change depending on the conditions, for example, it may be close to the millimeter level, and the probe and the workpiece may interfere. When such interference occurs, the workpiece and the probe may be damaged and cause problems.

專利文獻1所記載的發明,是偵測如此般探頭的碰撞而讓掃描停止。在專利文獻1的摘要記載一種超音波測定裝置,係具有超音波測定用的探頭1、探頭1之保持具2、讓保持具朝3方向移動等之掃描器3, ,利用掃描器3,4讓探頭1移動而進行超音波測定,且具備有: 用於感應伸縮雙方的應變之2個應變感測器31,32、以及對應於感測器31,32的狀態等而產生用於停止掃描器3, 的動作之偵測信號A之偵測電路260;感測器31,32,是以保持具2之中間部分的外表面、即彼此大致正交之2個面分別作為安裝面,且在前述安裝面雙方分別安裝成可感應大致平行的方向之應變。 The invention described in Patent Document 1 detects a collision of the probe and stops scanning. In summary Patent Document 1 describes one kind of ultrasonic measuring apparatus having a probe ultrasonic measurement system 1, the probe 1 of the holder 2, so that holder 3 toward the direction of movement of the scanner 3 and the like, The ultrasonic measurement is performed by moving the probe 1 with the scanners 3 and 4 and includes: two strain sensors 31 and 32 for sensing the strain of both sides of the telescoping and the states corresponding to the sensors 31 and 32 And so on for stopping the scanner 3 , The detection circuit 260 of the movement detection signal A; the sensors 31, 32 use the outer surface of the middle part of the holder 2, that is, the two surfaces that are approximately orthogonal to each other as the mounting surfaces, and are installed in the aforementioned installation Both sides of the surface are installed so as to be able to sense strain in a substantially parallel direction.

[專利文獻1]日本特開平7-103951公報 [Patent Document 1] Japanese Unexamined Patent Publication No. 7-103951

專利文獻1所記載的發明,是利用應變感測器來偵知超音波探頭之側面方向的應變,藉此偵測工件和探頭間的干涉。然而,近年因為超音波探頭的掃描速度極快,必須考慮水所造成之側面方向的應力。亦即,當超音波探頭進行掃描時,起因於水的應力會產生側面方向的應變,而可能將該應變誤判為超音波探頭和工件間的碰撞。此外,在專利文獻1所記載的發明,超音波探頭是固定於Z軸掃描器。因此和工件碰撞時會被施加大的應力,而可能使工件、探頭破損。 The invention described in Patent Document 1 uses a strain sensor to detect the strain in the lateral direction of the ultrasonic probe, thereby detecting interference between the workpiece and the probe. However, in recent years, because the scanning speed of the ultrasonic probe is extremely fast, the lateral stress caused by water must be considered. That is, when the ultrasonic probe scans, the stress caused by the water causes a strain in the lateral direction, which may be misjudged as a collision between the ultrasonic probe and the workpiece. Further, in the invention described in Patent Document 1, the ultrasonic probe is fixed to a Z-axis scanner. Therefore, a large stress will be applied when colliding with the workpiece, and the workpiece and the probe may be damaged.

於是,本發明的課題,是讓超音波影像裝置偵知探頭和工件間的干涉而防止探頭、工件受損。 Therefore, an object of the present invention is to allow an ultrasonic imaging device to detect interference between a probe and a workpiece and prevent damage to the probe and the workpiece.

為了解決前述課題,第1發明的超音波影像裝置係具備:利用超音波將面狀的工件予以影像化之探頭、對於前述工件的面讓前述探頭進行二維掃描之掃描手段、藉由偵測前述探頭之往上方的移動來偵測前述工件和前述探頭間的干涉之干涉偵測手段、在前述探頭的上部設置成與前述探頭成為一體化構造之凸緣部、以及用於保持前述探頭之保持具。此外,前述干涉偵測手段,是以一部分可從前述保持具之上表面突出的方式埋置於前述保持具內,當前述探頭和前述工件間未發生干涉時,前述突出部受前述凸緣部的按壓而埋藏於前述保持具內,當前述探頭和前述工件間發生干涉時,隨著前述探頭之往上方移動使前述凸緣部也往上方移動,藉此讓埋藏於前述保持具內之前述突出部復原,而偵測前述工件和前述探頭間之干涉。 In order to solve the aforementioned problems, the ultrasonic imaging apparatus of the first invention includes a scanning means for imaging a planar workpiece using ultrasonic waves, a scanning means for scanning the surface of the workpiece in a two-dimensional manner, and An interference detection means for detecting the interference between the workpiece and the probe by moving the probe upward, a flange portion provided on the upper portion of the probe to be integrated with the probe, and a means for holding the probe Holder. In addition, the interference detection means is embedded in the holder so that a part of the holder can protrude from the upper surface of the holder. When no interference occurs between the probe and the workpiece, the protruding portion is subjected to the flange portion. When the probe and the workpiece interfere with each other, as the probe moves upward, the flange portion also moves upward, thereby allowing the buried in the holder to move. The protruding portion is restored, and the interference between the workpiece and the probe is detected.

第2發明的超音波影像裝置,其特徵在於,係具備:利用超音波透過液體將面狀的工件予以影像化之探頭、對於前述工件的面讓前述探頭進行掃描之掃描手段、以及以非接觸的方式偵測前述工件和前述探頭間的靠近之干涉偵測手段。 A second aspect of the ultrasonic imaging device includes a probe for imaging a planar workpiece using ultrasonic waves through a liquid, a scanning means for scanning the surface of the workpiece, and a non-contact scanning method. An interference detection method for detecting the proximity between the workpiece and the probe in a manner.

關於其他的手段,在實施方式中做說明。 Other means will be described in the embodiment.

依據本發明,可讓超音波影像裝置偵知探頭和工件間的干涉而防止探頭、工件受損。 According to the invention, the ultrasonic imaging device can detect the interference between the probe and the workpiece and prevent the probe and the workpiece from being damaged.

1‧‧‧超音波影像裝置 1‧‧‧ Ultrasound Imaging Device

2‧‧‧三軸掃描器(掃描手段) 2‧‧‧ three-axis scanner (scanning means)

21‧‧‧X軸致動器(掃描手段) 21‧‧‧X-axis actuator (scanning means)

22‧‧‧Y軸致動器(掃描手段) 22‧‧‧Y-axis actuator (scanning means)

23‧‧‧Z軸致動器 23‧‧‧Z-axis actuator

24‧‧‧保持具 24‧‧‧ holder

241‧‧‧旋鈕 241‧‧‧ knob

243‧‧‧孔部 243‧‧‧Hole

244‧‧‧狹縫 244‧‧‧Slit

25‧‧‧基部 25‧‧‧ base

3、3A、3L、3R‧‧‧感測器(干涉偵測手段) 3, 3A, 3L, 3R‧‧‧ sensors (interference detection means)

4、4A、4B‧‧‧探頭 4, 4A, 4B‧‧‧ Probe

41‧‧‧前端部 41‧‧‧Front end

42‧‧‧凸緣部 42‧‧‧ flange

56‧‧‧控制裝置 56‧‧‧Control

7‧‧‧感測器機構 7‧‧‧ sensor mechanism

75‧‧‧極限開關 75‧‧‧ limit switch

8‧‧‧工件 8‧‧‧ Workpiece

81‧‧‧測定面 81‧‧‧Measurement surface

圖1係超音波影像裝置之整體構造圖。 FIG. 1 is an overall structural diagram of an ultrasonic imaging device.

圖2(a)(b)係利用探頭來測定工件之說明圖。 Fig. 2 (a) (b) is an explanatory diagram for measuring a workpiece using a probe.

圖3係顯示探頭和工件的位置關係。 Figure 3 shows the positional relationship between the probe and the workpiece.

圖4(a)(b)係顯示第1實施形態的保持具的動作之說明圖。 4 (a) and 4 (b) are explanatory views showing the operation of the holder of the first embodiment.

圖5係顯示第1實施形態的保持具構造。 Fig. 5 shows a holder structure of the first embodiment.

圖6係顯示第1實施形態的保持具構造之分解圖。 Fig. 6 is an exploded view showing a structure of a holder according to the first embodiment.

圖7係顯示第1實施形態之超音波掃描處理之流程圖。 Fig. 7 is a flowchart showing the ultrasonic scanning process of the first embodiment.

圖8係顯示第2實施形態之探頭的構造。 Fig. 8 shows the structure of a probe according to the second embodiment.

圖9係顯示第3實施形態之探頭的構造。 Fig. 9 shows the structure of a probe according to a third embodiment.

圖10係顯示比較例之探頭的構造。 Fig. 10 shows the structure of a probe of a comparative example.

以下,針對本發明的實施方式,參照各圖做詳細地說明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

圖1係超音波影像裝置的整體構造圖。 Fig. 1 is an overall configuration diagram of an ultrasonic imaging device.

超音波影像裝置1,係具備用於偵測探頭4和工件8間的干涉之功能。超音波影像裝置1可防止探頭4、工件8受損。 The ultrasonic imaging device 1 is provided with a function for detecting interference between the probe 4 and the workpiece 8. The ultrasonic imaging device 1 can prevent the probe 4 and the workpiece 8 from being damaged.

超音波影像裝置1係具備三軸掃描器2(掃描 手段)及探頭4。該三軸掃描器2,是對於平面狀的工件8讓探頭4進行二維掃描。超音波影像裝置1可利用超音波將平面狀的工件8予以影像化。 The ultrasound imaging device 1 is equipped with a three-axis scanner 2 (scanning Means) and probe 4. The three-axis scanner 2 scans a flat workpiece 8 in a two-dimensional manner with a probe 4. The ultrasonic imaging device 1 can image a planar workpiece 8 using an ultrasonic wave.

探頭4浸漬在裝滿水的水槽91中,且配置成使探頭4的前端與工件8對置。利用保持具24將探頭4安裝於三軸掃描器2。該三軸掃描器2,是讓探頭4進行二維掃描並偵知其掃描位置。藉此,超音波影像裝置1可將各掃描位置和回波的關係予以二維影像化。水槽91被載置於台92上。 The probe 4 is immersed in a water tank 91 filled with water, and is arranged so that the tip of the probe 4 faces the workpiece 8. The probe 4 is attached to the triaxial scanner 2 by a holder 24. The three-axis scanner 2 allows the probe 4 to perform two-dimensional scanning and detect its scanning position. Thereby, the ultrasonic imaging apparatus 1 can two-dimensionally image the relationship between each scanning position and the echo. The water tank 91 is placed on the table 92.

三軸掃描器2係具備:讓探頭4進行掃描之X軸致動器21及Y軸致動器22、可改變探頭4和工件8的間隔之Z軸致動器23、以及用於把持探頭4之保持具24。該保持具24係將設置於探頭4的上部之凸緣部42予以支承,當該探頭4被施加往上方的力時能使其平順地往上方移動。在保持具24設有感測器3,藉此偵知探頭4之往上方的移動。 The three-axis scanner 2 includes an X-axis actuator 21 and a Y-axis actuator 22 for scanning the probe 4, a Z-axis actuator 23 for changing the distance between the probe 4 and the workpiece 8, and a grip for the probe 4 的 住 具 24。 4 of the holder. The holder 24 supports a flange portion 42 provided on an upper portion of the probe 4, and when the probe 4 is applied with an upward force, the probe 4 can be smoothly moved upward. The holder 24 is provided with a sensor 3 to detect the upward movement of the probe 4.

在檢查前是藉由台92來調整探頭4的高度,並藉由Z軸致動器23來調整探頭4和工件8的間隔。 Before the inspection, the height of the probe 4 is adjusted by the stage 92, and the distance between the probe 4 and the workpiece 8 is adjusted by the Z-axis actuator 23.

超音波影像裝置1還具有:探頭4及發射器52、放大器53、用於處理該探頭4的輸出信號之接收器54及A/D轉換器55、控制裝置56、資料處理裝置57、以及顯示器58。 The ultrasound imaging device 1 further includes a probe 4 and a transmitter 52, an amplifier 53, a receiver 54 and an A / D converter 55 for processing an output signal of the probe 4, a control device 56, a data processing device 57, and a display. 58.

發射器52,在每個既定的掃描位置輸出信號。該信號例如為脈衝波、衝擊波(burst wave)的電氣信號。 The transmitter 52 outputs a signal at each predetermined scanning position. This signal is, for example, an electrical signal of a pulse wave or a burst wave.

利用發射器52的信號而讓探頭4輸出超音波後,放大器53將探頭4所接受的信號放大並朝接收器54輸出。接收器54將所接收的信號進一步放大並朝A/D轉換器55輸出。 After the probe 4 outputs an ultrasonic wave using the signal of the transmitter 52, the amplifier 53 amplifies the signal received by the probe 4 and outputs the signal to the receiver 54. The receiver 54 further amplifies the received signal and outputs it to the A / D converter 55.

透過接收器54將被工件8的測定面81反射後之回波輸入A/D轉換器55。A/D轉換器55係將該回波之類比信號實施選通(gate)處理後轉換成數位信號,並朝控制裝置56輸出。 The echo reflected by the measurement surface 81 of the workpiece 8 is transmitted to the A / D converter 55 through the receiver 54. The A / D converter 55 performs gate processing on the analog signal of the echo, converts the analog signal into a digital signal, and outputs the digital signal to the control device 56.

控制裝置56,係控制該三軸掃描器2而讓探頭4進行二維掃描,一邊取得探頭4之各掃描位置一邊用超音波來測定工件8。控制裝置56例如以X軸為主掃描方向、以Y軸為副掃描方向,最初讓探頭4移動到Y軸的始點位置。接著,控制裝置56,係讓探頭4朝向主掃描方向且去程方向移動而取得第奇數條掃描線的超音波資訊,並讓其朝副掃描方向移動1步。控制裝置56進一步讓探頭4朝向主掃描方向且回程方向移動而取得第偶數條掃描線的超音波資訊,並讓其朝副掃描方向移動1步。 The control device 56 controls the three-axis scanner 2 so that the probe 4 performs two-dimensional scanning, and the workpiece 8 is measured by ultrasonic waves while acquiring each scanning position of the probe 4. The control device 56 moves, for example, the X-axis as the main scanning direction and the Y-axis as the sub-scanning direction, and initially moves the probe 4 to the starting position of the Y-axis. Next, the control device 56 moves the probe 4 toward the main scanning direction and the outbound direction to obtain ultrasonic information of the odd-numbered scanning lines, and moves it in the sub scanning direction by one step. The control device 56 further moves the probe 4 toward the main scanning direction and the return direction to obtain ultrasonic information of the even-numbered scanning lines, and moves it to the sub-scanning direction by one step.

控制裝置56在掃描中,如果藉由感測器3偵知探頭4往上方移動的話,就將三軸掃描器2的動作停止。如此,可防止探頭4、工件8受損。 When the control device 56 detects that the probe 4 moves upward by the sensor 3 during scanning, it stops the operation of the triaxial scanner 2. In this way, damage to the probe 4 and the work 8 can be prevented.

將來自控制裝置56之工件8的各掃描位置、與其對應之超音波信號輸入資料處理裝置57。資料處理裝置57,係將對應於工件8的各掃描位置之超音波的測定結果進行影像化處理,將處理後的工件8之超音波影像顯示於 顯示器58。 Each scanning position of the workpiece 8 from the control device 56 and an ultrasonic signal corresponding thereto are input to the data processing device 57. The data processing device 57 is used for image processing the ultrasonic measurement results corresponding to each scanning position of the workpiece 8, and displays the ultrasonic image of the processed workpiece 8 on the Display 58.

圖2(a),(b)係利用探頭4來測定工件8之說明圖。 2 (a) and 2 (b) are explanatory diagrams of measuring a workpiece 8 using a probe 4. FIG.

在圖2(a)中,探頭4的前端部41位於離工件8之表面距離Z0的位置。這時,探頭4所輸出的超音波聚焦於工件8的測定面81。因此,這時的超音波影像是清晰的。該探頭4的前端部41呈錐狀。 In FIG. 2 (a), the front end portion 41 of the probe 4 is located at a distance Z 0 from the surface of the workpiece 8. At this time, the ultrasonic wave output from the probe 4 is focused on the measurement surface 81 of the work 8. Therefore, the ultrasonic image at this time is clear. The distal end portion 41 of the probe 4 is tapered.

在圖2(b)中,探頭4的前端部41位於:比圖2(a)的情況離工件8之表面更遠之距離Z1的位置。這時,探頭4所輸出的超音波聚焦於工件8的測定面81之上側。因此,這時的超音波影像沒有像圖2(a)的情況那樣清晰。因此探頭4和工件8的距離宜為圖2(a)所示的距離Z0In FIG. 2 (b), the front end portion 41 of the probe 4 is located at a distance Z 1 farther from the surface of the workpiece 8 than in the case of FIG. 2 (a). At this time, the ultrasonic wave output from the probe 4 is focused on the upper side of the measurement surface 81 of the work 8. Therefore, the ultrasonic image at this time is not as clear as in the case of FIG. 2 (a). Therefore, the distance between the probe 4 and the workpiece 8 should be the distance Z 0 shown in Fig. 2 (a).

圖3顯示探頭4和工件8的位置關係。 FIG. 3 shows the positional relationship between the probe 4 and the workpiece 8.

在藉由超音波影像裝置1進行工件8的觀察時,是在水槽91內設置台94,在該台94上載置工件8,在該水槽91內裝滿水後,利用Z軸致動器23來調整探頭4和工件8的間隔。在圖3所示的例子,探頭4和工件8是間隔著距離Z2,必須將其調整成圖2(a)所示的距離Z0When observing the workpiece 8 by the ultrasonic imaging device 1, a table 94 is set in the water tank 91, the workpiece 8 is placed on the table 94, and the water tank 91 is filled with water, and then the Z-axis actuator 23 is used. To adjust the distance between the probe 4 and the workpiece 8. In the example shown in FIG. 3, the probe 4 and the workpiece 8 are spaced apart from each other by a distance Z 2 , and must be adjusted to the distance Z 0 shown in FIG. 2 (a).

該距離Z0會依條件而改變,可能會靠近到毫米等級以下,那時在探頭4和工件8間可能發生干涉。在發生該干涉的情況,可能使探頭4及工件8受到損傷。因此,將用於固定超音波影像裝置1的探頭4之保持具24的構造予以改善,對其賦予可偵測探頭4和工件8間的接觸之功 能。 This distance Z 0 will change depending on the conditions, and may approach below the millimeter level, at which time interference may occur between the probe 4 and the workpiece 8. When such interference occurs, the probe 4 and the work 8 may be damaged. Therefore, the structure of the holder 24 for fixing the probe 4 of the ultrasonic imaging device 1 is improved, and a function of detecting the contact between the probe 4 and the workpiece 8 is provided.

《比較例》 Comparative Example

圖10顯示比較例的探頭4之構造的三面圖。圖10的上部為平面圖,該平面圖的下側為正面圖。正面圖的右側為側面圖。 FIG. 10 is a three-dimensional view showing the structure of the probe 4 of the comparative example. The upper part of FIG. 10 is a plan view, and the lower side of the plan view is a front view. The right side of the front view is a side view.

如平面圖所示般,探頭4固定於基部25。在探頭4的附近配置感測器機構7。 As shown in the plan view, the probe 4 is fixed to the base 25. A sensor mechanism 7 is arranged near the probe 4.

如正面圖及側面圖所示般,該感測器機構7係具備:往比探頭4的前端部41更下方伸出之保護部71、支柱部76、極限開關75、以及按壓部74。 As shown in the front view and the side view, the sensor mechanism 7 includes a protection portion 71 protruding below the front end portion 41 of the probe 4, a support portion 76, a limit switch 75, and a pressing portion 74.

支承部72、73將支柱部76支承成可沿上下方向移動,按壓部74係用於將極限開關75按壓,並用於將該感測器機構7保持於既定的高度。若保護部71與工件8發生干涉(接觸),支柱部76和按壓部74會朝上方移動,按壓部74變成不再按壓極限開關75。 The support portions 72 and 73 support the pillar portion 76 so as to be movable in the vertical direction. The pressing portion 74 is used to press the limit switch 75 and maintain the sensor mechanism 7 at a predetermined height. If the protection portion 71 interferes with (contacts with) the work 8, the support pillar portion 76 and the pressing portion 74 will move upward, and the pressing portion 74 will no longer press the limit switch 75.

控制裝置56,是利用該極限開關75來偵知感測器機構7和工件8間的接觸,藉此能夠在探頭4和工件8發生干涉之前偵測工件8的靠近。該感測器機構7構成可偵測探頭4和工件8間的干涉之干涉偵測手段。控制裝置56,當偵測到探頭4和工件8間的干涉時讓探頭4的掃描停止,藉此可將工件8、探頭4的損傷防範於未然。特別是能夠在探頭4和工件8發生干涉之前就將掃描停止,因此是有效的。 The control device 56 uses the limit switch 75 to detect the contact between the sensor mechanism 7 and the workpiece 8, thereby detecting the approach of the workpiece 8 before the probe 4 and the workpiece 8 interfere. The sensor mechanism 7 constitutes an interference detection means capable of detecting interference between the probe 4 and the workpiece 8. The control device 56 stops scanning of the probe 4 when interference between the probe 4 and the workpiece 8 is detected, thereby preventing damage to the workpiece 8 and the probe 4 beforehand. In particular, it is effective in that scanning can be stopped before the probe 4 and the workpiece 8 interfere with each other.

在比較例,是在探頭4的附近設置可偵知其與工件8間的接觸之感測器機構7,當該感測器機構7與工件8接觸時讓極限開關75動作,藉此可於工件8和探頭4接觸之前就讓動作停止。如此,可防止探頭4和工件8受損,而能讓超音波影像裝置1的附加價值提高。 In the comparative example, a sensor mechanism 7 is installed near the probe 4 to detect the contact between the sensor mechanism 7 and the workpiece 8. When the sensor mechanism 7 contacts the workpiece 8, the limit switch 75 is operated, thereby enabling the Stop the motion before the workpiece 8 and the probe 4 come into contact. In this way, the probe 4 and the work 8 can be prevented from being damaged, and the added value of the ultrasonic imaging device 1 can be improved.

然而,在比較例,因為探頭4和感測器機構7是分離的,當感測器機構7的保護部71未接觸工件8的情況,探頭4可能會和工件8發生干涉。此外,感測器機構7必須和探頭4一起進行掃描,因此必須具有既定的剛性。 However, in the comparative example, since the probe 4 and the sensor mechanism 7 are separated, when the protection portion 71 of the sensor mechanism 7 does not contact the workpiece 8, the probe 4 may interfere with the workpiece 8. In addition, since the sensor mechanism 7 must be scanned together with the probe 4, it must have a predetermined rigidity.

《第1實施形態》 "First Embodiment"

圖4(a),(b)係顯示第1實施形態之保持具24的動作之說明圖。 4 (a) and 4 (b) are explanatory diagrams showing the operation of the holder 24 of the first embodiment.

圖4(a)顯示探頭4之凸緣部42就座於保持具24之狀態。 FIG. 4 (a) shows a state where the flange portion 42 of the probe 4 is seated on the holder 24.

一般的保持具24,是以密合的狀態保持著探頭4。然而,本實施形態的保持具24,係將探頭4的凸緣部42支承,以既定的緊固力保持著探頭4而使其能往上方移動,利用感測器3來偵測探頭4的就座狀態。該感測器3例如為從保持具24的上部突出之短行程的觸動開關,當偵知探頭4之凸緣部42的按壓會導通(ON)。 The general holder 24 holds the probe 4 in a close state. However, the holder 24 of this embodiment supports the flange portion 42 of the probe 4 and holds the probe 4 with a predetermined tightening force so that it can move upward. The sensor 3 is used to detect the probe 4 Seat status. The sensor 3 is, for example, a short-stroke touch switch protruding from the upper portion of the holder 24, and is turned on when the flange portion 42 of the detection probe 4 is pressed.

圖4(b)顯示探頭4之凸緣部42未就座於保持具24之狀態。 FIG. 4 (b) shows a state where the flange portion 42 of the probe 4 is not seated on the holder 24.

若探頭4與工件8發生物理性干涉而往上方移動,探 頭4之凸緣部42成為未就座於保持具24的狀態。如此,感測器3變得無法偵知凸緣部42的按壓。亦即,感測器3可偵知探頭4和工件8間的干涉。探頭4的前端呈錐狀,在其與工件8發生干涉時,可對探頭4賦予朝向上方的彈壓力。探頭4並未固定於保持具,當其與工件發生碰撞時可往上方移動,而防止工件、探頭受損。 If the probe 4 and the workpiece 8 physically interfere and move upward, the probe The flange portion 42 of the head 4 is not seated on the holder 24. In this way, the sensor 3 cannot detect the pressing of the flange portion 42. That is, the sensor 3 can detect the interference between the probe 4 and the workpiece 8. The tip of the probe 4 has a tapered shape, and when it interferes with the work 8, it can apply a spring pressure to the probe 4 in an upward direction. The probe 4 is not fixed to the holder, and when it collides with the workpiece, it can be moved upward to prevent damage to the workpiece and the probe.

感測器3並不限定於觸動開關,也能使用例如距離感測器等之任意的感測器來偵測探頭4的就座狀態,並沒有特別的限定。 The sensor 3 is not limited to a touch switch, and an arbitrary sensor such as a distance sensor can be used to detect the seating state of the probe 4, and is not particularly limited.

圖5顯示第1實施形態之保持具24的構造。在圖的上部為平面圖,在圖的下部為側面圖。 FIG. 5 shows the structure of the holder 24 of the first embodiment. The top view is a plan view, and the bottom view is a side view.

在保持具24形成有:狹縫244、以及供探頭4插入之孔部243。保持具24具備有旋鈕241、彈簧245、軸環246。在旋鈕241的前端攻製公螺紋,藉此和保持具24的母螺紋進行緊固螺合。藉由轉動旋鈕241,該旋鈕241可透過彈簧245對保持具24賦予緊固力。利用該狹縫244、旋鈕241及彈簧245,不拘作業者誰都能用一定的緊固力將探頭4保持於孔部243。 The holder 24 is formed with a slit 244 and a hole portion 243 into which the probe 4 is inserted. The holder 24 includes a knob 241, a spring 245, and a collar 246. A male thread is tapped at the front end of the knob 241, thereby tightening and screwing with the female thread of the holder 24. By turning the knob 241, the knob 241 can apply a tightening force to the holder 24 through the spring 245. With the slit 244, the knob 241, and the spring 245, any operator can hold the probe 4 in the hole 243 with a certain tightening force.

軸環246限制旋鈕241的可動範圍,藉此限制旋鈕241對保持具24賦予的緊固力。關於旋鈕241的構造,在隨後的圖6詳細說明。 The collar 246 restricts the movable range of the knob 241, thereby restricting the tightening force given to the holder 24 by the knob 241. The structure of the knob 241 will be described in detail later with reference to FIG. 6.

當探頭4的前端未與工件8發生接觸(干涉)時,探頭4的凸緣部42成為就座於保持具24的狀態。當探頭4的前端與工件8發生接觸(干涉)時,探頭4會平順 地往上方移動而使凸緣部42成為未就座於保持具24的狀態。感測器3偵知凸緣部42所致之按壓,藉此可偵測凸緣部42是否就座於保持具24。 When the tip of the probe 4 is not in contact (interference) with the workpiece 8, the flange portion 42 of the probe 4 is in a state of being seated on the holder 24. When the tip of the probe 4 comes into contact (interference) with the workpiece 8, the probe 4 will be smooth The flange portion 42 is moved upward so that the flange portion 42 is not seated on the holder 24. The sensor 3 detects the pressure caused by the flange portion 42, thereby detecting whether the flange portion 42 is seated on the holder 24.

當探頭4的前端與工件8發生接觸時,其會相對於保持具24進行移動。利用感測器3來偵測該移動,藉此可偵知探頭4和工件8間的干涉(接觸)。當偵知干涉時讓探頭4的掃描停止,藉此可防止探頭4和工件8受損。 When the front end of the probe 4 comes into contact with the workpiece 8, it moves relative to the holder 24. This movement is detected by the sensor 3, whereby interference (contact) between the probe 4 and the workpiece 8 can be detected. When the interference is detected, scanning of the probe 4 is stopped, thereby preventing damage to the probe 4 and the work 8.

圖6顯示第1實施形態之保持具24的構造之分解圖。 FIG. 6 is an exploded view showing the structure of the holder 24 of the first embodiment.

在旋鈕241的前端形成有公螺紋,在旋鈕241的軸上裝設彈簧245及軸環246。形成於該旋鈕241的前端之公螺紋,是與保持具24的母螺紋緊固螺合。旋鈕241所緊固的位置,是保持具24當中之被狹縫244分割的裡側。 A male screw is formed at the tip of the knob 241, and a spring 245 and a collar 246 are attached to the shaft of the knob 241. The male screw formed at the front end of the knob 241 is fastened and screwed with the female screw of the holder 24. The position where the knob 241 is fastened is the inner side of the holder 24 divided by the slit 244.

若將旋鈕241旋入保持具24,屬於彈性體之彈簧245會將保持具24當中被狹縫244分割之前側朝向裡側彈壓。亦即,將對應於旋鈕241的旋入量之緊固力彈壓於該保持具24之前側和裡側,不拘作業者誰都能用一定的緊固力將探頭4保持於孔部243。此外,軸環246限制旋鈕241的可動範圍。如此,能使旋鈕241所致的緊固力成為既定值以下,而能防止探頭4破壞。 If the knob 241 is screwed into the holder 24, the spring 245, which is an elastic body, will press the side of the holder 24 before it is divided by the slit 244 toward the inside. That is, the fastening force corresponding to the amount of screwing of the knob 241 is elastically pressed against the front side and the back side of the holder 24, and any operator can hold the probe 4 in the hole portion 243 with a certain fastening force. In addition, the collar 246 limits the movable range of the knob 241. In this way, the tightening force by the knob 241 can be made below a predetermined value, and the probe 4 can be prevented from being broken.

圖7顯示第1實施形態的超音波掃描處理之流程圖。 Fig. 7 shows a flowchart of the ultrasonic scanning process of the first embodiment.

超音波影像裝置1是利用控制裝置56來實施超音波 掃描處理。 The ultrasound imaging device 1 implements an ultrasound using the control device 56 Scan processing.

若控制裝置56開始讓探頭4進行掃描(步驟S10),首先判斷是否偵測到探頭4和工件8間的干涉(步驟S11)。如果控制裝置56偵測到探頭4和工件8間的干涉(步驟S11→是),將探頭4的掃描停止(步驟S17)而異常結束。如此,可防止探頭4和工件8受損,而能讓超音波影像裝置1之附加價值提高。 If the control device 56 starts scanning the probe 4 (step S10), it is first determined whether an interference between the probe 4 and the workpiece 8 is detected (step S11). If the control device 56 detects the interference between the probe 4 and the workpiece 8 (step S11 → YES), the scanning of the probe 4 is stopped (step S17) and the process ends abnormally. In this way, the probe 4 and the work 8 can be prevented from being damaged, and the added value of the ultrasonic imaging device 1 can be improved.

如果控制裝置56未偵測到探頭4和工件8間的干涉(步驟S11→否),對探頭4發送超音波脈衝(步驟S12)後,接收超音波(步驟S13)。資料處理裝置57進行該接收波的資料處理(步驟S14)。控制裝置56反覆進行步驟S11~S14之一連串處理直到掃描結束為止(步驟S15→否)。 If the control device 56 does not detect the interference between the probe 4 and the workpiece 8 (step S11 → No), it sends an ultrasonic pulse to the probe 4 (step S12), and then receives the ultrasonic wave (step S13). The data processing device 57 performs data processing of the received wave (step S14). The control device 56 repeatedly performs a series of processes from steps S11 to S14 until the scanning is completed (step S15 → No).

當控制裝置56結束掃描時(步驟S15→否),資料處理裝置57根據該接收波的資料處理結果產生超音波影像,結束圖7的處理。 When the control device 56 finishes scanning (step S15 → No), the data processing device 57 generates an ultrasonic image based on the data processing result of the received wave, and ends the processing of FIG. 7.

《第2實施形態》 "Second Embodiment"

圖8顯示第2實施形態之探頭4A的構造。 FIG. 8 shows the structure of a probe 4A according to the second embodiment.

在探頭4A的前端設置可偵測工件8的靠近之感測器3A。該感測器3A例如為利用電磁感應之高頻振盪型的近接感測器,因此能以非接觸的方式偵測工件8,不致使工件8、感測器3A受損。藉此,可將探頭4A和工件8間的干涉防範於未然。感測器3A因為應答速度快且沒有電氣 接點,因此壽命更長。 A sensor 3A is provided at the front end of the probe 4A to detect the approach of the workpiece 8. The sensor 3A is, for example, a proximity sensor using a high-frequency oscillation type of electromagnetic induction, and therefore can detect the workpiece 8 in a non-contact manner without causing damage to the workpiece 8 and the sensor 3A. Thereby, interference between the probe 4A and the workpiece 8 can be prevented beforehand. Sensor 3A has fast response time and no electrical Contacts for longer life.

若工件8靠近探頭4A,控制裝置56可利用感測器3A來偵測該靠近。這時讓探頭4A的掃描停止,藉此可將探頭4A和工件8的損傷防範於未然。藉此,能讓超音波影像裝置1的附加價值提高。 If the workpiece 8 approaches the probe 4A, the control device 56 can detect the approach using the sensor 3A. At this time, the scanning of the probe 4A is stopped, thereby preventing damage to the probe 4A and the work 8 in advance. Thereby, the added value of the ultrasonic imaging device 1 can be improved.

《第3實施形態》 "Third Embodiment"

圖9顯示第3實施形態的探頭4B之構造。圖9的左右方向為掃描方向之去程及回程的方向。 FIG. 9 shows the structure of the probe 4B according to the third embodiment. The left and right directions in FIG. 9 are the forward and backward directions in the scanning direction.

在保持具24B之主掃描方向的兩側設置感測器3L、3R。該感測器3L、3R是雷射距離計,能以非接觸的方式偵測工件8,因此可防止工件8、感測器3A受損。例如,在主掃描方向的去程,利用感測器3L測定其與工件8的距離,在主掃描方向的回程,利用感測器3R測定其與工件8的距離。如此,可將探頭4A和工件8間的干涉防範於未然。感測器3L具備光導部31L,感測器3R具備光導部31R。作業者將光導部31L、31R浸漬於水中,藉此可防止在水面之雷射光的亂反射,而能測定其與工件8的距離。 Sensors 3L, 3R are provided on both sides in the main scanning direction of the holder 24B. The sensors 3L and 3R are laser distance meters, which can detect the workpiece 8 in a non-contact manner, so the workpiece 8 and the sensor 3A can be prevented from being damaged. For example, in the main scanning direction, the distance from the workpiece 8 is measured by the sensor 3L, and in the main scanning direction, the distance from the workpiece 8 is measured by the sensor 3R. In this way, interference between the probe 4A and the workpiece 8 can be prevented beforehand. The sensor 3L includes a light guide 31L, and the sensor 3R includes a light guide 31R. The operator can immerse the light guide portions 31L and 31R in water, thereby preventing random reflection of laser light on the water surface, and can measure the distance from the workpiece 8.

若工件8靠近探頭4B,控制裝置56可利用感測器3L、3R來偵測該靠近。這時讓探頭4B的掃描停止,藉此可將探頭4B和工件8的損傷防範於未然。如此,能讓超音波影像裝置1的附加價值提高。 If the workpiece 8 approaches the probe 4B, the control device 56 may detect the approach using the sensors 3L and 3R. At this time, the scanning of the probe 4B is stopped, thereby preventing damage to the probe 4B and the work 8 in advance. In this way, the added value of the ultrasonic imaging device 1 can be increased.

(變形例) (Modification)

本發明並不限定於上述之各實施形態,可包含各式各樣的變形例。例如在上述的實施形態,為了便於理解本發明而進行詳細地說明,但不一定要具備所說明之所有的構造。可將某實施形態之構造的一部分置換為其他實施形態的構造,也能在某實施形態的構造加入其他實施形態的構造。此外,關於各實施形態之構造的一部分,可進行其他構造的追加、刪除、置換。 The present invention is not limited to the embodiments described above, and may include various modifications. For example, the above-mentioned embodiment is described in detail in order to facilitate understanding of the present invention, but it is not necessary to have all the structures described. A part of the structure of one embodiment may be replaced with a structure of another embodiment, and a structure of another embodiment may be added to the structure of one embodiment. In addition, a part of the structure of each embodiment can be added, deleted, or replaced with another structure.

在各實施形態中,控制線、資訊線係顯示說明上所需者,並未顯示製品上所有的控制線、資訊線。實際上,也能想成幾乎所有的構造都相互連接在一起。 In each embodiment, the control lines and information lines are displayed as required in the description, and not all control lines and information lines on the product are displayed. In fact, it can also be imagined that almost all structures are connected to each other.

作為本發明的變形例,例如含以下的(a)~(c)。 As a modification of the present invention, for example, the following (a) to (c) are included.

(a)在第1實施形態,是利用開關來偵測探頭4和工件8間的干涉。然而並不限定於此,亦可利用任意的感測器、例如按壓偵知感測器等,來判斷探頭4的凸緣部42是否就座於保持具24。 (a) In the first embodiment, a switch is used to detect interference between the probe 4 and the workpiece 8. However, the present invention is not limited to this, and it is also possible to determine whether the flange portion 42 of the probe 4 is seated on the holder 24 using an arbitrary sensor, for example, a press detection sensor.

(b)在第1實施形態,若偵測到探頭4和工件8間的干涉,就將探頭4的掃描停止。然而並不限定於此,亦可改變探頭4的高度後將工件8再度進行掃描。 (b) In the first embodiment, if interference between the probe 4 and the workpiece 8 is detected, scanning of the probe 4 is stopped. However, it is not limited to this, and the height of the probe 4 may be changed to scan the workpiece 8 again.

(c)在第2實施形態,是藉由利用電磁感應之高頻振盪型的近接感測器來偵測探頭4和工件8間的干涉。然而並不限定於此,亦可使用靜電容型的近接感測器、磁氣型的近接感測器。當使用磁氣型的近接感測器的情況,例如可使台94等成為磁性體。 (c) In the second embodiment, interference between the probe 4 and the workpiece 8 is detected by a proximity sensor using a high-frequency oscillation type of electromagnetic induction. However, it is not limited to this, and a proximity sensor of a capacitance type or a proximity sensor of a magnetic type may be used. When a magnetic proximity sensor is used, for example, the stage 94 or the like can be made a magnetic body.

Claims (8)

一種超音波影像裝置,其特徵在於,係具備:利用超音波透過液體將面狀的工件予以影像化之探頭、對於前述工件的面讓前述探頭進行掃描之掃描手段、在前述探頭的上部設置成與前述探頭成為一體化構造之凸緣部、用於保持前述探頭之保持具、以及以一部分從前述保持具之上表面突出的方式埋置於前述保持具內之干涉偵測手段;前述干涉偵測手段,當前述探頭和前述工件間未發生干涉時,前述突出部受前述凸緣部的按壓而埋藏於前述保持具內;當前述探頭和前述工件間發生干涉時,隨著前述探頭之往上方移動而使前述凸緣部也往上方移動,藉此讓埋藏於前述保持具內之前述突出部復原,而偵測前述工件和前述探頭間的干涉。An ultrasonic imaging device, comprising: a probe for imaging a planar workpiece using ultrasonic waves through a liquid; a scanning means for scanning the probe surface of the workpiece; and an upper part of the probe is provided. A flange portion integrated with the probe, a holder for holding the probe, and an interference detection means embedded in the holder so that a part of the flange protrudes from the upper surface of the holder; the interference detection When there is no interference between the probe and the workpiece, the protruding portion is buried in the holder by the pressing of the flange portion; when interference occurs between the probe and the workpiece, the probe moves toward the probe. Moving upward causes the flange portion to also move upward, thereby restoring the protruding portion buried in the holder, and detecting interference between the workpiece and the probe. 如申請專利範圍第1項所述之超音波影像裝置,其中,前述探頭的前端是呈錐狀。The ultrasonic imaging device according to item 1 of the scope of patent application, wherein the tip of the probe is tapered. 如申請專利範圍第1或2項所述之超音波影像裝置,其中,前述掃描手段,若藉由前述干涉偵測手段偵測到干涉,則將前述探頭的掃描停止。The ultrasonic imaging device according to item 1 or 2 of the scope of patent application, wherein if the scanning means detects interference by the interference detecting means, the scanning of the probe is stopped. 如申請專利範圍第1或2項所述之超音波影像裝置,其中,前述掃描手段,若藉由前述干涉偵測手段偵測到干涉,則將前述探頭的高度變更而進行再度掃描。The ultrasonic imaging device according to item 1 or 2 of the scope of patent application, wherein, if the scanning means detects interference by the interference detecting means, the height of the probe is changed to perform scanning again. 如申請專利範圍第1或2項所述之超音波影像裝置,其中,前述保持具,係將前述探頭以既定的緊固力予以保持。The ultrasonic imaging device according to item 1 or 2 of the scope of patent application, wherein the holder is used to hold the probe with a predetermined tightening force. 如申請專利範圍第5項所述之超音波影像裝置,其中,在前述保持具形成有用於將前述探頭夾住並保持之孔、及狹縫,並具備旋鈕及彈性部,該旋鈕及該彈性部債是用於調整施加於被該狹縫分割之兩部分的力。The ultrasonic imaging device according to item 5 of the scope of patent application, wherein the holder is provided with a hole and a slit for holding and holding the probe, and is provided with a knob and an elastic portion, and the knob and the elastic portion The debt is used to adjust the force applied to the two parts divided by the slit. 如申請專利範圍第6項所述之超音波影像裝置,其中,前述保持具,係具備用於限制前述旋鈕的可動範圍之限制構件。The ultrasonic imaging device according to item 6 of the scope of patent application, wherein the holder is provided with a restricting member for restricting a movable range of the knob. 如申請專利範圍第1或2項所述之超音波影像裝置,其中,前述干涉偵測手段,係偵測前述探頭的就座狀態之感測器。The ultrasonic imaging device according to item 1 or 2 of the scope of patent application, wherein the interference detection means is a sensor that detects the sitting state of the probe.
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