US3186880A - Method of producing unsupported epitaxial films of germanium by evaporating the substrate - Google Patents
Method of producing unsupported epitaxial films of germanium by evaporating the substrate Download PDFInfo
- Publication number
- US3186880A US3186880A US229546A US22954662A US3186880A US 3186880 A US3186880 A US 3186880A US 229546 A US229546 A US 229546A US 22954662 A US22954662 A US 22954662A US 3186880 A US3186880 A US 3186880A
- Authority
- US
- United States
- Prior art keywords
- substrate
- semiconductive material
- unsupported
- film
- germanium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0005—Separation of the coating from the substrate
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/915—Separating from substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/135—Removal of substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/169—Vacuum deposition, e.g. including molecular beam epitaxy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/977—Thinning or removal of substrate
Definitions
- This invention relates in general to a method of producing unsupported films of semiconductive material and more specifically to a vacuum deposition method for producing unsupported, epitaxial films of semiconductive material of a quality suitable for minority-carrier semiconductor device preparation.
- the semiconductive material of which a film is desired to be formed is placed in a crucible which may be controllably heated, as for example by electrical resistance wires surrounding the crucible.
- a supporting material, or substrate, which is also provided with a control-led heating source, is positioned near the crucible and these elements are placed within an air-tight enclosure such as a bell jar, upon which a vacuum is then drawn. Heat is applied to the crucible to vaporize the semiconductive material, which subsequently condenses on the surface of the heated substrate to form the desired film.
- ditficulty has been experienced in the past with respect to the unassisted wrinkling and cracking of the film upon cooling immediately following the deposition thereof. This has been due to the elevated temperatnres at which such vacuum deposition processes are normally carried out, e.g. 400 C. 600 (3., and to the large difierences in the coefiicients of thermal expansion between the substrates and the deposited materials.
- This invention seeks to overcome the above-noted and other disadvantages inherent in the prior art, and has as its primary object the provision of an effective and inexpensive method of producing films of semiconductive material.
- Another object of the invention is to provide a method of producing unsupported films of semiconductive material sufficiently thick to have electrical characteristics similar to bulk material.
- Yet another object of the invention is to provide a method of producing unsupported epitaxial (and therefore having a mono-crystalline structure) films of semiconductive material suitable for use as substrates for subsequent depositions of other semiconductive materials, thereby making possible the fabrication of active electrical elements whose film properties may be completely utilized without any limitations being imposed by the presence of extraneous substrates or supports.
- a base or table 1 on which is seated in air tight relationship a glass bell jar 2, indicated by a broken line.
- a conventional oil diffusion pump vacuum apparatus (not shown), which is capable of drawing a high vacuum on the bell jar.
- five supporting rods, 4, 5, 6, 7 and 8, mounted on the base are five supporting rods, 4, 5, 6, 7 and 8, used to support various operative elements of the apparatus, as will later be more fully described.
- Mounted on supporting rods 6 and 7 is a carbon crucible 9 surrounded by a first tantalum foil heater 10.
- the crucible is preferably made of carbon since most of the more common metals have a tendency to alloy with molten semiconductive materials.
- thermocouple 12 A source of semiconductive material 11 is shown contained in the crucible.
- the crucible and heater are provided with a first temperature sensing thermocouple 12.
- the electrical connections to the heater and thermocouple are not shown as they are immaterial to the scope of this invention. They may take any conventional form as long as their communication with the exterior of the vacuum chamber is made through air tight passages.
- the heater current may be manually controlled and the thermocouple output may be visually monitored, as by observing the needle deflection of a temperature calibrated voltmeter to which the thermocouple leads are connected, or, as another alternative, the thermocouple output may be used to control the magnitude of the heater current in the manner of an automatic thermostat.
- movable shutters l3 and 14 Mounted on supporting post 5 are two movable shutters l3 and 14, one being positioned immediately beneath a substrate 15 and the other being positioned over the crucible 9. These shutters may be formed from a thin Stainless steel sheet if desired and may be manually swung into or out of the position shown by the rotation of supporting rod 5 which projects through the base 1.
- Thesubstrate 15 is held in a mask 16 which may be made of spectrographic carbon (a mask of carbonsupported by a double mask of stainless steel), and in which a second thermocouple 17 is imbedded.
- the mask 16 is in' turn mounted on supporting rod 3.
- the substrate heater assembly Positioned directly above the substrate 15 and mounted between supporting rods 4 and 8 is the substrate heater assembly,indicated generally by reference numeral 18.
- the substrate heater assembly includes a second tantalum-foil heater 19 to which are afiixed ceramic standoffsZti which support a stainless steel reflector 21; Qnce again, the electrical connections to'the second heater and thermocouple are not shown, but may be provided in any conventional manner.
- V tantalum-foil heater 19 to which are afiixed ceramic standoffsZti which support a stainless steel reflector 21; Qnce again, the electrical connections to'the second heater and thermocouple are not shown, but may be provided in any conventional manner.
- a germanium source is placed in the carbon crucible and a substrate of cleaved sodium chloride (NaCl) is placed a in position on the mask 16.
- NaCl cleaved sodium chloride
- Sodium chloride and germanium are two materials that have been found to be especially compatible for use with this invention since both have similar crystalline structures, which is essential 3 for epitaxial growth, and the vaporization temperature of sodium chloride is only slightly above the temperature at which such epitaxial growth takes place when the germaniumis vacuum evaporated and subsequently condensed on the surface of the sodium chloride.
- the bell jar is fitted in position and a vacuum of between 3X10 mm. Hg and 5 10 mm.
- Hg is drawn.
- the movable shutters 13 and 14 are rotated to the side presenting a clear path between the germanium source 11 and the sodium chloride substrate 15, and current is applied to the substrate heater until a temperature of approximately 530 C. is indicated by the thermocouple embedded in the mask. At this point a current is passed through the crucible heater sutficient to heat it to above the melting temperature of germanium (between 1450 and 1500 Q). As the germanium source 11 liquefies it evaporates and subsequently condenses in a thin epitaxial film or layer on the unmasked surface of the sodium chloride substrate.
- the crucible heater When the film reaches the desired thickness, which may be closely controlled by regulating the vaporization time, the crucible temperature, the distance between the source and substrate, etc., the crucible heater is de-energized and the substrate temperature is slowly raised, at a rate of about 10 C. per minute, to approximately 630 C., at which temperature the sodium chloride substrate begins to vaporize.
- the movable shutters 13 and 14 are rotated back into the position shown in the drawing, and when the substrate evaporization is complete, the previously deposited film of germanium falls free and is caught intact and undamaged on the upper shutter 13.
- a method of producing an unsupported film of semiconductive material comprising the discrete steps of:
- a method of producing an unsupported film of semiconductive material comprising the discrete steps of: (a) forming a coated substrate by depositing a thin film of vaporized semiconductive material on the surface of a substrate suspended in a vacuum, the vaporization temperature of said substrate being higher than the temperature suitable for vapor deposition and lower than the vaporization temperature of the semiconductive material;
- a method of producing an unsupported, epitaxial film of semiconductive material comprising the discrete steps of:
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Vapour Deposition (AREA)
Description
June 1, 1965 c. w. SKAGGS ETAL 3,186,380
METHOD OF PRODUCING UNSUPPORTED EPITAXIAL FILMS OF GERMANIUM. BY EVAPORATING THE SUBSTIATE Filed Oct. 10. 1962 INVENTORS CLYDE W. SKAGGS BY EUGENE A. LEARY ATTORNEYS United States Patent 3,186,880 METHOD 0F PRQDUCING UNSUPPORTED EPITAXIAL FILMS 0F GERMANIUM BY EVAPGRATTNG THE SUBSTRATE (Hyde W. Skaggs, Baitimore, Md and Eugene A. Leary,
Schenectady, N.Y., assignors to Martin-Marietta Corporation, Baltimore, Md., a corporation of Maryland Fiied Oct. 10, 1962, Ser. No. 229,546 4 Claims. (Cl. 1481.6)
This invention relates in general to a method of producing unsupported films of semiconductive material and more specifically to a vacuum deposition method for producing unsupported, epitaxial films of semiconductive material of a quality suitable for minority-carrier semiconductor device preparation.
As is well known by those familiar with the art of producing semiconductive devices, one of the most common methods employed to produce thin films or layers of semiconductive material, such as germanium, silicon, selenium, tellurium, cadmium, and the like, is that of vacuum deposition. In carrying out this method, the semiconductive material of which a film is desired to be formed is placed in a crucible which may be controllably heated, as for example by electrical resistance wires surrounding the crucible. A supporting material, or substrate, which is also provided with a control-led heating source, is positioned near the crucible and these elements are placed within an air-tight enclosure such as a bell jar, upon which a vacuum is then drawn. Heat is applied to the crucible to vaporize the semiconductive material, which subsequently condenses on the surface of the heated substrate to form the desired film.
In the past it has been common practice to utilize the resulting bi-layer structure as a unitary assembly rather than attempt to separate the film from the substrate. This restriction has been largely due to the diificulties experienced when attempting to effect a separation. Owing to the extreme thinness of films deposited in this manner, rendering them especially delicate and fragile, and also due to the strong cohesive bond formed between the film and the substrate, the physical separation of the two has most often resulted in the tearing, cracking, breaking, or similar destruction of the film, leaving it wholly unsuitable for use as an electrical element.
in addition ditficulty has been experienced in the past with respect to the unassisted wrinkling and cracking of the film upon cooling immediately following the deposition thereof. This has been due to the elevated temperatnres at which such vacuum deposition processes are normally carried out, e.g. 400 C. 600 (3., and to the large difierences in the coefiicients of thermal expansion between the substrates and the deposited materials.
This invention seeks to overcome the above-noted and other disadvantages inherent in the prior art, and has as its primary object the provision of an effective and inexpensive method of producing films of semiconductive material.
Another object of the invention is to provide a method of producing unsupported films of semiconductive material sufficiently thick to have electrical characteristics similar to bulk material.
Yet another object of the invention is to provide a method of producing unsupported epitaxial (and therefore having a mono-crystalline structure) films of semiconductive material suitable for use as substrates for subsequent depositions of other semiconductive materials, thereby making possible the fabrication of active electrical elements whose film properties may be completely utilized without any limitations being imposed by the presence of extraneous substrates or supports.
Briefly, these and other objects that will be readily apparent to one familiar with the art to which this invention pertains, are achieved by selecting a semiconductive material and substrate material having similar crystalline structures (necessary to produce epitaxial layers), forming a film of the semiconductive material on the substrate by a vacuum deposition process, and then slowly raising the temperature of the resulting bi-layer structure to the temperature at which the substrate vaporizes. Upon evaporation of the substrate, what is left is the desired unsupported, epitaxial film of semiconductive material preserved in its deposited structural form.
The invention may be best understood from a consideration of the following preferred embodiment described in conjunction with the single illustration in the drawing.
Referring now to the drawing, there is shown a base or table 1 on which is seated in air tight relationship a glass bell jar 2, indicated by a broken line. Associated with the bell jar and communicating with its interior via the exhaust port 3 is a conventional oil diffusion pump vacuum apparatus (not shown), which is capable of drawing a high vacuum on the bell jar. Also mounted on the base are five supporting rods, 4, 5, 6, 7 and 8, used to support various operative elements of the apparatus, as will later be more fully described. Mounted on supporting rods 6 and 7 is a carbon crucible 9 surrounded by a first tantalum foil heater 10. The crucible is preferably made of carbon since most of the more common metals have a tendency to alloy with molten semiconductive materials. A source of semiconductive material 11 is shown contained in the crucible. The crucible and heater are provided with a first temperature sensing thermocouple 12. The electrical connections to the heater and thermocouple are not shown as they are immaterial to the scope of this invention. They may take any conventional form as long as their communication with the exterior of the vacuum chamber is made through air tight passages. The heater current may be manually controlled and the thermocouple output may be visually monitored, as by observing the needle deflection of a temperature calibrated voltmeter to which the thermocouple leads are connected, or, as another alternative, the thermocouple output may be used to control the magnitude of the heater current in the manner of an automatic thermostat.
Mounted on supporting post 5 are two movable shutters l3 and 14, one being positioned immediately beneath a substrate 15 and the other being positioned over the crucible 9. These shutters may be formed from a thin Stainless steel sheet if desired and may be manually swung into or out of the position shown by the rotation of supporting rod 5 which projects through the base 1. Thesubstrate 15 is held in a mask 16 which may be made of spectrographic carbon (a mask of carbonsupported by a double mask of stainless steel), and in which a second thermocouple 17 is imbedded. The mask 16 is in' turn mounted on supporting rod 3. Positioned directly above the substrate 15 and mounted between supporting rods 4 and 8 is the substrate heater assembly,,indicated generally by reference numeral 18. The substrate heater assembly includes a second tantalum-foil heater 19 to which are afiixed ceramic standoffsZti which support a stainless steel reflector 21; Qnce again, the electrical connections to'the second heater and thermocouple are not shown, but may be provided in any conventional manner. V
The method'of this invention will now be described withreference to an exemplary set of parameters that have been found to yield highly satisfactory results. A germanium source is placed in the carbon crucible and a substrate of cleaved sodium chloride (NaCl) is placed a in position on the mask 16. Sodium chloride and germanium are two materials that have been found to be especially compatible for use with this invention since both have similar crystalline structures, which is essential 3 for epitaxial growth, and the vaporization temperature of sodium chloride is only slightly above the temperature at which such epitaxial growth takes place when the germaniumis vacuum evaporated and subsequently condensed on the surface of the sodium chloride. The bell jar is fitted in position and a vacuum of between 3X10 mm. Hg and 5 10 mm. Hg is drawn. The movable shutters 13 and 14 are rotated to the side presenting a clear path between the germanium source 11 and the sodium chloride substrate 15, and current is applied to the substrate heater until a temperature of approximately 530 C. is indicated by the thermocouple embedded in the mask. At this point a current is passed through the crucible heater sutficient to heat it to above the melting temperature of germanium (between 1450 and 1500 Q). As the germanium source 11 liquefies it evaporates and subsequently condenses in a thin epitaxial film or layer on the unmasked surface of the sodium chloride substrate. When the film reaches the desired thickness, which may be closely controlled by regulating the vaporization time, the crucible temperature, the distance between the source and substrate, etc., the crucible heater is de-energized and the substrate temperature is slowly raised, at a rate of about 10 C. per minute, to approximately 630 C., at which temperature the sodium chloride substrate begins to vaporize. The movable shutters 13 and 14 are rotated back into the position shown in the drawing, and when the substrate evaporization is complete, the previously deposited film of germanium falls free and is caught intact and undamaged on the upper shutter 13.
Good quality unsupported, epitaxial germanium films have been produced in this manner ranging in thickness from 4000A to 16000A, as measured from a microscope cover glass monitor with a Zeiss interference microscope. These films have electrical characteristics similar to bulk material and are themselves suitable for use as substrates for the subsequent deposition of other semiconductive materials in the fabrication of active electrical elements.
While the invention has been specifically described with reference to a semiconductor source material of germanium and a substrate of sodium chloride, other compatible materials selected in accordance with the criteria presented herein may be equally amenable to use With the method and apparatus disclosed, and such are to be deemed as being within the spirit and scope of the invention, as well as slight modifications therein which will be apparent to those skilled in the art.
What is therefore claimed and desired to be secured by Letters Patent is:
1. A method of producing an unsupported film of semiconductive material comprising the discrete steps of:
(a) forming a coated substrate by depositing a thin film of vaporized semiconductive material on the surface of a substrate suspended in a vacuum, the vaporization temperature of said substrate being higher than the temperature suitable for vapor deposition and lower than the vaporization temperature of the semiconductive material;
(b) continuously heating said coated substrate above the vaporization temperature of said substrate to vaporize said substrate, thereby leaving ,an unsupported film of semiconductive material;
(c) cooling said unsupported film of semiconductive material; and (d) catching intact and undamaged said unsupported film of semiconductive material as it falls free.
2. A method of producing an unsupported film of semiconductive material comprising the discrete steps of: (a) forming a coated substrate by depositing a thin film of vaporized semiconductive material on the surface of a substrate suspended in a vacuum, the vaporization temperature of said substrate being higher than the temperature suitable for vapor deposition and lower than the vaporization temperature of the semiconductive material;
(b) continuously heating said coated substrate above the vaporization temperature of said substrate to vaporize said substrate, thereby leaving an unsupported film of semiconductive material;
(c) cooling said unsupported film of semiconductive material as it falls free; and
(d) catching intact and undamaged said unsupported film of semiconductive material as it falls free.
3. A method of producing an unsupported, epitaxial film of semiconductive material comprising the discrete steps of:
(a) forming a coated substrate by depositing a thin epitaxial film of vaporized semiconductive material on the surface of a substrate suspended in a vacuum, said semiconductive material and said substrate having substantially similar crystalline structures, and the vaporization temperature of said substrate being higher than the temperature suitable for epitaxial growth of said semiconductive material thereon and being lower than the vaporization temperature of said semiconductive material;
(b) continuously heating said coated substrate above the vaporization temperature of said substrate to vaporize said substrate, thereby leaving an unsupported epitaxial film of semiconductive material;
(0) cooling said unsupported, epitaxial film of semiconductive material; and
(d) catching intact and undamaged said unsupported, epitaxial film of semiconductive material as it falls free.
. 4. A method. of producing an unsupported, epitaxial film of germanium comprising the discrete steps of:
(a) forming a coated substrate by depositing a thin epitaxial film of vaporized germanium on the surface of a cleaved sodium chloride substrate suspended in a vacuum;
(b) continuously heating said cleaved sodium chloride substrate above the vaporization temperature of said substrate to vaporize said substrate, thereby leaving an unsupported, epitaxial film of germanium;
(c) cooling said unsupported, epitaxial film of germanium; and
(d) catching intact and undamaged said unsupported,
epitaxial film of germanium as it falls free.
FOREIGN PATENTS 1/ 42 Germany.
3/5 8 Great Britain.
3 60 Great Britain. 11/60 Great Britain.
HYLAND BIZOT, Primary Examiner.
DAVID L. RECK, Examiner.
Claims (1)
1. A METHOD OF PRODUCING AN UNSUPPORTED FILM OF SEMICONDUCTIVE MATERIAL COMPRISING THE DISCRETE STEPS OF: (A) FORMING A COATED SUBSTATE BY DEPOSITING A THIN FILM OF VAPORIZED SEMICONDUCTIVE MATERIAL ON THE SURFACE OF A SUBSTRATE SUSPENDED IN A VACUUM, THE VAPORIZATION TEMPERATURE OF SAID SUBSTRATE BEING HIGHER THAN THE TEMPERATURE SUITABLE FOR VAPOR DEPOSITION AND LOWER THAN THE VAPORIZATION TEMPERATURE ON THE SEMICONDUCTIVE MATERIAL; (B) CONTINUOUSLY HEATING SAID COATED SUBSTRATE ABOVE THE VAPORIZATION TEMPERATURE OF SAID SUBSTRATE TO VAPORIZE SAID SUBSTRATE, THEREBY LEAVING AN UNSUPPORTED FILM OF SEMICONDUCTIVE MATERIAL; (C) COOLING SAID UNSUPPORTED FILM OF SEMICONDUCTIVE MATERIAL; AND (D) CATCHING INTACT AND UNDAMAGED SAID UNSUPPORTED FILM OF SEMICONDUCTIVE MATERIAL AS IT FALLS FREE.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US229546A US3186880A (en) | 1962-10-10 | 1962-10-10 | Method of producing unsupported epitaxial films of germanium by evaporating the substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US229546A US3186880A (en) | 1962-10-10 | 1962-10-10 | Method of producing unsupported epitaxial films of germanium by evaporating the substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
US3186880A true US3186880A (en) | 1965-06-01 |
Family
ID=22861701
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US229546A Expired - Lifetime US3186880A (en) | 1962-10-10 | 1962-10-10 | Method of producing unsupported epitaxial films of germanium by evaporating the substrate |
Country Status (1)
Country | Link |
---|---|
US (1) | US3186880A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3370980A (en) * | 1963-08-19 | 1968-02-27 | Litton Systems Inc | Method for orienting single crystal films on polycrystalline substrates |
US3376107A (en) * | 1963-10-10 | 1968-04-02 | Oka Akira | Stoichiometric transition metal hydrides |
US3514323A (en) * | 1965-04-20 | 1970-05-26 | Noranda Mines Ltd | Epitaxial selenium coating on tellurium substrate |
US3546032A (en) * | 1966-11-01 | 1970-12-08 | Philips Corp | Method of manufacturing semiconductor devices on substrates consisting of single crystals |
US4255208A (en) * | 1979-05-25 | 1981-03-10 | Ramot University Authority For Applied Research And Industrial Development Ltd. | Method of producing monocrystalline semiconductor films utilizing an intermediate water dissolvable salt layer |
WO1981002948A1 (en) * | 1980-04-10 | 1981-10-15 | Massachusetts Inst Technology | Methods of producing sheets of crystalline material and devices made therefrom |
US4421592A (en) * | 1981-05-22 | 1983-12-20 | United Technologies Corporation | Plasma enhanced deposition of semiconductors |
US4537651A (en) * | 1981-05-22 | 1985-08-27 | United Technologies Corporation | Method for removing semiconductor layers from salt substrates |
US5217564A (en) * | 1980-04-10 | 1993-06-08 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5273616A (en) * | 1980-04-10 | 1993-12-28 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5328549A (en) * | 1980-04-10 | 1994-07-12 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5362682A (en) * | 1980-04-10 | 1994-11-08 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5588994A (en) * | 1980-04-10 | 1996-12-31 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US9310396B2 (en) | 2013-03-05 | 2016-04-12 | Alliance For Sustainable Energy, Llc | Apparatus and methods of measuring minority carrier lifetime using a liquid probe |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE717461C (en) * | 1940-10-22 | 1942-02-14 | Dr Eckhard Fenner | Process for the production of foils using a sublimable carrier |
US2619414A (en) * | 1950-05-25 | 1952-11-25 | Bell Telephone Labor Inc | Surface treatment of germanium circuit elements |
GB792006A (en) * | 1955-08-25 | 1958-03-19 | Gen Electric Co Ltd | Improvements in or relating to the preparation of single crystals of silicon |
GB831359A (en) * | 1956-12-13 | 1960-03-30 | Monsanto Chemicals | Process for the production of silicon |
GB853979A (en) * | 1956-03-05 | 1960-11-16 | Motorola Inc | Improvements in or relating to the preparation of monocrystalline structures |
-
1962
- 1962-10-10 US US229546A patent/US3186880A/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE717461C (en) * | 1940-10-22 | 1942-02-14 | Dr Eckhard Fenner | Process for the production of foils using a sublimable carrier |
US2619414A (en) * | 1950-05-25 | 1952-11-25 | Bell Telephone Labor Inc | Surface treatment of germanium circuit elements |
GB792006A (en) * | 1955-08-25 | 1958-03-19 | Gen Electric Co Ltd | Improvements in or relating to the preparation of single crystals of silicon |
GB853979A (en) * | 1956-03-05 | 1960-11-16 | Motorola Inc | Improvements in or relating to the preparation of monocrystalline structures |
GB831359A (en) * | 1956-12-13 | 1960-03-30 | Monsanto Chemicals | Process for the production of silicon |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3370980A (en) * | 1963-08-19 | 1968-02-27 | Litton Systems Inc | Method for orienting single crystal films on polycrystalline substrates |
US3376107A (en) * | 1963-10-10 | 1968-04-02 | Oka Akira | Stoichiometric transition metal hydrides |
US3514323A (en) * | 1965-04-20 | 1970-05-26 | Noranda Mines Ltd | Epitaxial selenium coating on tellurium substrate |
US3546032A (en) * | 1966-11-01 | 1970-12-08 | Philips Corp | Method of manufacturing semiconductor devices on substrates consisting of single crystals |
US4255208A (en) * | 1979-05-25 | 1981-03-10 | Ramot University Authority For Applied Research And Industrial Development Ltd. | Method of producing monocrystalline semiconductor films utilizing an intermediate water dissolvable salt layer |
US4727047A (en) * | 1980-04-10 | 1988-02-23 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material |
US5273616A (en) * | 1980-04-10 | 1993-12-28 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5676752A (en) * | 1980-04-10 | 1997-10-14 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
WO1981002948A1 (en) * | 1980-04-10 | 1981-10-15 | Massachusetts Inst Technology | Methods of producing sheets of crystalline material and devices made therefrom |
US4816420A (en) * | 1980-04-10 | 1989-03-28 | Massachusetts Institute Of Technology | Method of producing tandem solar cell devices from sheets of crystalline material |
US4837182A (en) * | 1980-04-10 | 1989-06-06 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material |
US5217564A (en) * | 1980-04-10 | 1993-06-08 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5588994A (en) * | 1980-04-10 | 1996-12-31 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5328549A (en) * | 1980-04-10 | 1994-07-12 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5362682A (en) * | 1980-04-10 | 1994-11-08 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US5549747A (en) * | 1980-04-10 | 1996-08-27 | Massachusetts Institute Of Technology | Method of producing sheets of crystalline material and devices made therefrom |
US4421592A (en) * | 1981-05-22 | 1983-12-20 | United Technologies Corporation | Plasma enhanced deposition of semiconductors |
US4537651A (en) * | 1981-05-22 | 1985-08-27 | United Technologies Corporation | Method for removing semiconductor layers from salt substrates |
US9310396B2 (en) | 2013-03-05 | 2016-04-12 | Alliance For Sustainable Energy, Llc | Apparatus and methods of measuring minority carrier lifetime using a liquid probe |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US3186880A (en) | Method of producing unsupported epitaxial films of germanium by evaporating the substrate | |
US3206322A (en) | Vacuum deposition means and methods for manufacture of electronic components | |
US3514320A (en) | Method of forming single crystal films by nonepitaxial growth | |
US3939292A (en) | Process for stable phase III potassium nitrate and articles prepared therefrom | |
US3862857A (en) | Method for making amorphous semiconductor thin films | |
US3934059A (en) | Method of vapor deposition | |
US5478425A (en) | Method of making a thin film detector with an aerogel layer | |
US3099588A (en) | Formation of semiconductor transition regions by alloy vaporization and deposition | |
US3603285A (en) | Vapor deposition apparatus | |
US2447805A (en) | Composite resinous sheet of birefringent material and method of making the same | |
Terada | Vacuum deposition of tin-selenium films | |
US3740690A (en) | Electro-optical detector | |
JP3323522B2 (en) | Molecular beam cell | |
JPS58204173A (en) | Device and method for vapor deposition | |
DE10341914A1 (en) | Device for producing thin layers of coating components/elements, alloys or compounds on a substrate comprises a cylindrical pot, a cylindrical tube, a substrate heater, a lid, a radiation shield, and a source for the coating components | |
KR0149716B1 (en) | Fabrication method of insb thin film | |
US2617153A (en) | Manufacture of silica membranes | |
JP3616186B2 (en) | Method for producing chalcopyrite thin film | |
Rep | III V acuum P rocessing T echniques--III Abstr~ c~-o. | |
Sharma et al. | The preparation of InSb films | |
JP3679574B2 (en) | Manufacturing method of ultra-thin niobium and copper single crystal multilayer film | |
RU2175692C2 (en) | Device for forming multilayer structures | |
Chaudhary | Knudsen Type Vacuum Evaporation Source. | |
JPS6023992Y2 (en) | Zinc oxide thin film production equipment | |
JPH0462453B2 (en) |