US3632462A - Dicing of semiconductors - Google Patents
Dicing of semiconductors Download PDFInfo
- Publication number
- US3632462A US3632462A US797610A US3632462DA US3632462A US 3632462 A US3632462 A US 3632462A US 797610 A US797610 A US 797610A US 3632462D A US3632462D A US 3632462DA US 3632462 A US3632462 A US 3632462A
- Authority
- US
- United States
- Prior art keywords
- acid
- tray
- wafer
- etching
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/1919—Control of temperature characterised by the use of electric means characterised by the type of controller
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/08—Apparatus, e.g. for photomechanical printing surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Definitions
- Apparatus comprises a tray on which the wafer is placed, means for circulating an etching acid in a path including said tray, and means in said path for controlling the temperature of the acid.
- the usual arrangement is merely to pour acid into the tray without any circulation or temperature control. For this reason the life of a given batch of acid is limited, because if the acid temperature is too low the etching time is increased, but if the acid temperature becomes too high, the wax masks tend to become lifted from the wafer.
- a typical arrangement using three liters of acid will etch 20 wafers.
- An arrangement in accordance with one example of the invention using 12 liters of acid which was circulated was found to etch successfully 160 wafers of the same size, an overall improvement of 100 percent.
- a tray 11 in which wafers to be etched are placed, the tray having an inlet for a suitable etching acid, and an outlet, so that acid flows through the tray continuously.
- a suitable acid is of known fon'n including nitric acid, hydrofluoric acid and acetic acid. From the outlet, acid flows to a reservoir 12, from which a pump 13 supplies the acid to a water-cooled heat exchanger 14, which in turn supplies the acid to the inlet of the tray.
- the outlet of the pump may be connected to the tray through some form of valve 15 to control the amount of acid supplied to the tray.
- a temperature probe 16 for sensing the temperature of the acid leaving the tray, the probe being connected to a solenoid which operates a valve controlling the amount of water flowing to the heat exchanger.
- Water is circulated from a reservoir 17 to the heat exchanger 14 by a pump 18 at a rate determined by a valve 19 which in turn is controlled by a solenoid 21 connected to an controlled by the probe 16.
- the arrangement is such that the acid is kept at a constant temperature which is chosen to be sufficiently low to avoid removal of the wax masks on the wafer, but sufficiently high to ensure that etching takes place at an acceptable rate.
- a suitable temperature using a typical wax having a melting point of C. is in the range 10 to 14 C., preferably.
- an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tray, the improvement comprising cooling means in said path for controlling the temperature of the acid.
- a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
- Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
- a method of dicing semiconductors comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Automation & Control Theory (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
- Dicing (AREA)
Abstract
In the manufacture of semiconductors by forming a large number of devices on one wafer, protecting the individual devices by wax masks and then subjecting the wafer to an etching acid to separate the devices, apparatus is used for separating the wafers comprising a tray on which the wafer is placed. Means is provided for circulating an etching acid in a path including the tray, and in this path there is means for controlling the temperature of the acid.
Description
United States Patent m1 3,632,462
[72] Inventor Colin Arthur Harrington [50] Field of Search 156/345, 17
Sutton Coldfield, England [21] Appl. No. 797,610 Relerences Cited [22] Filed Feb. 7, 1969 UNITED STATES PATENTS Patented Jan. 4, 1972 std Limited 3,095,463 6/ 1963 Chang et al [56/345 UX [73] Amgnee g es) Primary Examiner-Jacob H. Steinberg 32 Priority Feb. 9, 1968 5mm [3 3] Great Britain ABSTRACT: In the manufacture of semiconductors by forming a large number of devices on one wafer, protecting the in- [54] meme 0F SEMCONDUCTORS dividual devices by wax masks and then subjecting the wafe;
4 Claims 1 Dnwing a. to an etchrng acid to separate the devices, apparatus IS use for separating the wafers compnsmg a tray on which the wafer [52] US. Cl. 156/345, is placed, Means is provided for circulating an etching acid in 156/17 a path including the tray, and in this path there is means for [5] 1 Int. Cl. controlling the temperature of the acid HE T /4 PUMP EXCHANGE? rmmeum 41972 31632462 L? 15 i5? EXCHANGEE I/ H i 15 PUMP /7 {9 INVE TO? I xi" AWO ENEYS meme F SEMICONDUCTORS In the manufacture of semiconductors it is common to form a large number of devices on one wafer, then to protect the individual devices by wax masks and to subject the wafer to an etching acid to separate and dice the devices. This invention relates to apparatus for performing the etching operation.
Apparatus according to the invention comprises a tray on which the wafer is placed, means for circulating an etching acid in a path including said tray, and means in said path for controlling the temperature of the acid.
The usual arrangement is merely to pour acid into the tray without any circulation or temperature control. For this reason the life of a given batch of acid is limited, because if the acid temperature is too low the etching time is increased, but if the acid temperature becomes too high, the wax masks tend to become lifted from the wafer. Using the conventional technique, a typical arrangement using three liters of acid will etch 20 wafers. An arrangement in accordance with one example of the invention using 12 liters of acid which was circulated was found to etch successfully 160 wafers of the same size, an overall improvement of 100 percent.
An example of the invention is illustrated diagrammatically in the accompanying drawing.
Referring to the drawing, there is provided a tray 11 in which wafers to be etched are placed, the tray having an inlet for a suitable etching acid, and an outlet, so that acid flows through the tray continuously. A suitable acid is of known fon'n including nitric acid, hydrofluoric acid and acetic acid. From the outlet, acid flows to a reservoir 12, from which a pump 13 supplies the acid to a water-cooled heat exchanger 14, which in turn supplies the acid to the inlet of the tray. The outlet of the pump may be connected to the tray through some form of valve 15 to control the amount of acid supplied to the tray.
Between the outlet of the tray and the reservoir 12 is a temperature probe 16 for sensing the temperature of the acid leaving the tray, the probe being connected to a solenoid which operates a valve controlling the amount of water flowing to the heat exchanger. Water is circulated from a reservoir 17 to the heat exchanger 14 by a pump 18 at a rate determined by a valve 19 which in turn is controlled by a solenoid 21 connected to an controlled by the probe 16. The arrangement is such that the acid is kept at a constant temperature which is chosen to be sufficiently low to avoid removal of the wax masks on the wafer, but sufficiently high to ensure that etching takes place at an acceptable rate. A suitable temperature using a typical wax having a melting point of C. is in the range 10 to 14 C., preferably.
Having thus described my invention what I claim as new and desire to secure by Letters Patent is:
1. ln an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tray, the improvement comprising cooling means in said path for controlling the temperature of the acid.
2. Apparatus as claimed in claim 1 in which a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
3. Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
4. In a method of dicing semiconductors, said method comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.
Claims (4)
1. In an apparatus for performing a separation etching operation on a wax-masked semiconductor wafer, to dice said wafer comprising a tray on which the wafer is placed and means for circulating an etching acid in a path including said tRay, the improvement comprising cooling means in said path for controlling the temperature of the acid.
2. Apparatus as claimed in claim 1 in which a pump supplies acid to the tray through a heat exchanger, the temperature of the etching acid being sensed by a temperature probe which controls the rate of supply of coolant to the heat exchanger.
3. Apparatus as claimed in claim 2 including a valve for controlling the rate of flow of the etching acid.
4. In a method of dicing semiconductors, said method comprising the steps of forming a number of devices on one wafer; applying wax masks to the individual devices to protect the individual devices; placing the devices on a tray and circulating etching acid therethrough; the improvement comprising cooling the circulating etching acid.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB646268 | 1968-02-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
US3632462A true US3632462A (en) | 1972-01-04 |
Family
ID=9814926
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US797610A Expired - Lifetime US3632462A (en) | 1968-02-09 | 1969-02-07 | Dicing of semiconductors |
Country Status (4)
Country | Link |
---|---|
US (1) | US3632462A (en) |
DE (1) | DE1905732A1 (en) |
GB (1) | GB1239573A (en) |
NL (1) | NL6901837A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4950872A (en) * | 1972-09-18 | 1974-05-17 | ||
US3964957A (en) * | 1973-12-19 | 1976-06-22 | Monsanto Company | Apparatus for processing semiconductor wafers |
US4142893A (en) * | 1977-09-14 | 1979-03-06 | Raytheon Company | Spray etch dicing method |
US4633893A (en) * | 1984-05-21 | 1987-01-06 | Cfm Technologies Limited Partnership | Apparatus for treating semiconductor wafers |
US4738272A (en) * | 1984-05-21 | 1988-04-19 | Mcconnell Christopher F | Vessel and system for treating wafers with fluids |
US4740249A (en) * | 1984-05-21 | 1988-04-26 | Christopher F. McConnell | Method of treating wafers with fluid |
US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
US4856544A (en) * | 1984-05-21 | 1989-08-15 | Cfm Technologies, Inc. | Vessel and system for treating wafers with fluids |
US4911761A (en) * | 1984-05-21 | 1990-03-27 | Cfm Technologies Research Associates | Process and apparatus for drying surfaces |
US4984597A (en) * | 1984-05-21 | 1991-01-15 | Cfm Technologies Research Associates | Apparatus for rinsing and drying surfaces |
US5286657A (en) * | 1990-10-16 | 1994-02-15 | Verteq, Inc. | Single wafer megasonic semiconductor wafer processing system |
US6143087A (en) * | 1991-10-04 | 2000-11-07 | Cfmt, Inc. | Methods for treating objects |
US6328809B1 (en) | 1998-10-09 | 2001-12-11 | Scp Global Technologies, Inc. | Vapor drying system and method |
US20080006292A1 (en) * | 1996-09-30 | 2008-01-10 | Bran Mario E | System for megasonic processing of an article |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3095463A (en) * | 1958-03-12 | 1963-06-25 | Crucible Steel Co America | Temperature control apparatus |
-
1968
- 1968-02-09 GB GB646268A patent/GB1239573A/en not_active Expired
-
1969
- 1969-02-05 NL NL6901837A patent/NL6901837A/xx unknown
- 1969-02-06 DE DE19691905732 patent/DE1905732A1/en active Pending
- 1969-02-07 US US797610A patent/US3632462A/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3095463A (en) * | 1958-03-12 | 1963-06-25 | Crucible Steel Co America | Temperature control apparatus |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4950872A (en) * | 1972-09-18 | 1974-05-17 | ||
US3964957A (en) * | 1973-12-19 | 1976-06-22 | Monsanto Company | Apparatus for processing semiconductor wafers |
US4142893A (en) * | 1977-09-14 | 1979-03-06 | Raytheon Company | Spray etch dicing method |
US4911761A (en) * | 1984-05-21 | 1990-03-27 | Cfm Technologies Research Associates | Process and apparatus for drying surfaces |
US4984597A (en) * | 1984-05-21 | 1991-01-15 | Cfm Technologies Research Associates | Apparatus for rinsing and drying surfaces |
US4740249A (en) * | 1984-05-21 | 1988-04-26 | Christopher F. McConnell | Method of treating wafers with fluid |
US4738272A (en) * | 1984-05-21 | 1988-04-19 | Mcconnell Christopher F | Vessel and system for treating wafers with fluids |
US4856544A (en) * | 1984-05-21 | 1989-08-15 | Cfm Technologies, Inc. | Vessel and system for treating wafers with fluids |
US4633893A (en) * | 1984-05-21 | 1987-01-06 | Cfm Technologies Limited Partnership | Apparatus for treating semiconductor wafers |
US4917123A (en) * | 1984-05-21 | 1990-04-17 | Cfm Technologies Limited Partnership | Apparatus for treating wafers with process fluids |
US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
US5286657A (en) * | 1990-10-16 | 1994-02-15 | Verteq, Inc. | Single wafer megasonic semiconductor wafer processing system |
US6143087A (en) * | 1991-10-04 | 2000-11-07 | Cfmt, Inc. | Methods for treating objects |
US6348101B1 (en) | 1991-10-04 | 2002-02-19 | Cfmt, Inc. | Methods for treating objects |
US20080006292A1 (en) * | 1996-09-30 | 2008-01-10 | Bran Mario E | System for megasonic processing of an article |
US7518288B2 (en) | 1996-09-30 | 2009-04-14 | Akrion Technologies, Inc. | System for megasonic processing of an article |
US8257505B2 (en) | 1996-09-30 | 2012-09-04 | Akrion Systems, Llc | Method for megasonic processing of an article |
US8771427B2 (en) | 1996-09-30 | 2014-07-08 | Akrion Systems, Llc | Method of manufacturing integrated circuit devices |
US6328809B1 (en) | 1998-10-09 | 2001-12-11 | Scp Global Technologies, Inc. | Vapor drying system and method |
Also Published As
Publication number | Publication date |
---|---|
GB1239573A (en) | 1971-07-21 |
NL6901837A (en) | 1969-08-12 |
DE1905732A1 (en) | 1969-11-20 |
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